X-Ray diffraction is a tool for the investigation of the fine structure of matter. Initially X-Ray diffraction was used only for the determination of crystal structure but now a days the data from X-ray diffraction have also been  used to determine the crystalline size using Debye-Scherrer formula.  Generally one has to deal with limited data because of laborious and time consuming manual methods of calculation. Sometime calculations with lots of data are required in order to determine different crystalline sizes for the statistical analysis or other applications.